Products
High Resolution Calibration
High Magnification, High resolution Reference
and Calibration Standards for AFM, SEM, Auger and FIB
Holographic Grating for Scanning Electron Microscopy,
Atomic Force Microscopy, Auger and Focused Ion Beam
Precision, holographic patterns, provide accurate calibration and feature high stability and usability. Moderate ridge heights are convenient for AFM. Specimens provide good contrast for secondary and backscatter imaging with SEM.
They enable accurate calibration for high resolution, nanometer-scale measurements.
Available with 145 and 292nm pitch.
145nm Pitch Calibration Standard for AFM
Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements.
| Period: | 145nm pitch nominal, one dimensional array. Accuracy is +/- 1nm. Calibration certificate will give the actual pitch of the standard. |
| Surface structure: | Aluminum lines on glass, 4x6mm dimensions. Line height (about 100nm) and line width (about 75nm) are not calibrated. |
| Usability: | The calibrated pattern covers the entire standard. There is sufficient usable area to make tens of thousands of measurements without reusing any areas contaminated or altered by previous scans. |
| AFM: | Use in contact, tapping and other modes with image sizes from 250nm to 10um. Available unmounted or mounted on a 12mm steel AFM disk. |
| Certification: | Comes with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements. |
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 642-1AFM | 145nm Very High Resolution AFM Reference Standard on 12mm steel disk |
Each | € 1.237,80 | ||
| 642-1 | 145nm Very High Resolution AFM Reference Standard, Unmounted |
Each | € 1.048,20 |
292nm Pitch High Magnification, High Resolution
Precision holographic grating standard with high contrast and excellent edge definition
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 643-1AFM | 292nm High Resolution AFM Reference Standard on 12mm steel disk |
Each | € 1.999,60 |
292nm Pitch High Magnification, High Resolution
Precision holographic grating standard with high contrast and excellent edge definition
SEM Holders
| Type | Prod. No. | Data (D=Head dia.; P=Pin dia.; PL=Pin (length) | |
|---|---|---|---|
| A | 16111 |  |
Pin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom |
| B | 16261 |  |
Pin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY |
| C | 16221 |  |
9.5mm dia. x 9.5mm Cylinder, JEOL |
| D | 16281 |  |
15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON |
| E | 16291 |  |
15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON |
| F | 16111-9 | |
Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS |
| G | You Supply Mount or Mount of Your Choice, not listed here (contact customer service) | ||
| K | 16324 |  |
15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight |
| L | 16327 |  |
25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight |
| M | 16231 |  |
12.2mm dia. x 10mm Cylinder, JEOL |
| O | 16115 |  |
31.7mm dia. x 6.47mm, Cambridge S4 Mount |
| P | 16242 |  |
Pin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head |
| Q | 16153 |  |
25mm dia. x 10mm Cylinder, JEOL |
| R | 16144 |  |
Pin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom |
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 643-1 | 292nm High Resolution AFM Reference Standard, Unmounted |
Each | € 1.904,30 | ||
| 643-1A | 292nm High Resolution AFM Reference Standard, Mount A |
Each | € 1.999,60 | ||
| 643-1B | 292nm High Resolution AFM Reference Standard, Mount B |
Each | € 1.999,60 | ||
| 643-1C | 292nm High Resolution AFM Reference Standard, Mount C |
Each | € 1.999,60 | ||
| 643-1D | 292nm High Resolution AFM Reference Standard, Mount D |
Each | € 1.999,60 | ||
| 643-1E | 292nm High Resolution AFM Reference Standard, Mount E |
Each | € 1.999,60 | ||
| 643-1F | 292nm High Resolution AFM Reference Standard, Mount F |
Each | € 1.999,60 | ||
| 643-1G | 292nm High Resolution AFM Reference Standard, Mount G, you supply mount |
Each | p.o.r. | ||
| 643-1K | 292nm High Resolution AFM Reference Standard, Mount K |
Each | € 1.999,60 | ||
| 643-1L | 292nm High Resolution AFM Reference Standard, Mount L |
Each | € 1.999,60 | ||
| 643-1M | 292nm High Resolution AFM Reference Standard, Mount M |
Each | € 1.999,60 | ||
| 643-1O | 292nm High Resolution AFM Reference Standard, Mount O |
Each | € 1.999,60 | ||
| 643-1P | 292nm High Resolution AFM Reference Standard, Mount P |
Each | € 1.999,60 | ||
| 643-1Q | 292nm High Resolution AFM Reference Standard, Mount Q |
Each | € 1.999,60 | ||
| 643-1R | 292nm High Resolution AFM Reference Standard, Mount R |
Each | € 1.999,60 |
292nm Pitch High Magnification, High Resolution
Precision holographic grating standard with high contrast and excellent edge definition
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 643-11AFM | 292nm High Resolution AFM Reference Standard on 12mm steel disk certified |
Each | € 7.301,20 |
292nm Pitch High Magnification, High Resolution
Precision holographic grating standard with high contrast and excellent edge definition
SEM Holders
| Type | Prod. No. | Data (D=Head dia.; P=Pin dia.; PL=Pin (length) | |
|---|---|---|---|
| A | 16111 | |
Pin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom |
| B | 16261 | |
Pin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY |
| C | 16221 | |
9.5mm dia. x 9.5mm Cylinder, JEOL |
| D | 16281 | |
15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON |
| E | 16291 | |
15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON |
| F | 16111-9 | |
Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS |
| G | You Supply Mount or Mount of Your Choice, not listed here (contact customer service) | ||
| K | 16324 | |
15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight |
| L | 16327 | |
25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight |
| M | 16231 | |
12.2mm dia. x 10mm Cylinder, JEOL |
| O | 16115 | |
31.7mm dia. x 6.47mm, Cambridge S4 Mount |
| P | 16242 | |
Pin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head |
| Q | 16153 | |
25mm dia. x 10mm Cylinder, JEOL |
| R | 16144 | |
Pin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom |
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 643-11 | 292nm High Resolution AFM Reference Standard, Traceable, Unmounted |
Each | € 6.669,50 | ||
| 643-11A | 292nm High Resolution AFM Reference Standard, Traceable, Mount A |
Each | € 8.268,00 | ||
| 643-11B | 292nm High Resolution AFM Reference Standard, Traceable, Mount B |
Each | € 9.380,20 | ||
| 643-11C | 292nm High Resolution AFM Reference Standard, Traceable, Mount C |
Each | € 7.301,20 | ||
| 643-11D | 292nm High Resolution AFM Reference Standard, Traceable, Mount D |
Each | € 9.270,20 | ||
| 643-11E | 292nm High Resolution AFM Reference Standard, Traceable, Mount E |
Each | € 8.838,10 | ||
| 643-11F | 292nm High Resolution AFM Reference Standard, Traceable, Mount F |
Each | € 6.620,30 | ||
| 643-11G | 292nm High Resolution AFM Reference Standard, Traceable, Mount G, you supply mount |
Each | € 6.440,00 | ||
| 643-11K | 292nm High Resolution AFM Reference Standard, Traceable, Mount K |
Each | € 6.440,00 | ||
| 643-11L | 292nm High Resolution AFM Reference Standard, Traceable, Mount L |
Each | € 9.379,90 | ||
| 643-11M | 292nm High Resolution AFM Reference Standard, Traceable, Mount M |
Each | € 7.799,70 | ||
| 643-11O | 292nm High Resolution AFM Reference Standard, Traceable, Mount O |
Each | € 8.268,00 | ||
| 643-11P | 292nm High Resolution AFM Reference Standard, Traceable, Mount P |
Each | € 8.268,00 | ||
| 643-11Q | 292nm High Resolution AFM Reference Standard, Traceable, Mount Q |
Each | € 6.100,80 | ||
| 643-11R | 292nm High Resolution AFM Reference Standard, Traceable, Mount R |
Each | € 6.100,80 |
