Products
AFM-SPM calibration
AFM Image of Cross Line Grating Replica
2,000 lines/mm cross line grating replica is suitable for X-Y calibration.
The replicas have well-defined trench type grooves, which makes it easy to determine the 500nm pitch.
The 677-AFM Grating Replica is made of cellulose acetate.
It replaces the previous #607-AFM Grating Replica with 463nm pitch.
The 677-STM Grating Replica is a carbon replica with Au/Pd shadowing supported on a 400 square mesh, 3mm copper TEM grid which is mounted on a 12mm disc.
It replaces the previous #607-STM Grating Replica with 463nm pitch.
Technical Note
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Download Technical Note – Product No. 677-AFM |
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Download Technical Note – Product No. 677-STM |
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 677-AFM | X-Y Cross Line Grating Replica, 2000 lines/mm, Cellulose Acetate, mounted on 12mm AFM/STM Specimen Disc |
Each | € 84,40 | ||
| 677-AFM-10 | X-Y Cross Line Grating Replica, 2000 lines/mm, Cellulose Acetate, mounted on 10mm AFM/STM Specimen Disc |
Each | € 88,00 | ||
| 677-STM | X-Y Cross Line Grating Replica, 2000 lines/mm, Carbon/Au/Pd Coated, mounted on 12mm AFM/STM Specimen Disc |
Each | € 87,30 |
The 607-STM Grating Replica is a carbon replica with Au/Pd shadowing for X-Y calibration with 2,160 lines/mm crossed lines.
Made on a 400 square mesh, 3mm copper TEM grid; mounted on a 12mm stainless steel STM disc.
Technical Note
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Download Technical Note |
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 607-STM | X-Y Cross Line Grating Replica, Carbon/Au/Pd Coated, mounted on 12mm specimen disc |
Each | € 90,80 |
HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopy.
It is also used as a calibration specimen and cleaves almost like mica because of its layered structure.
Unlike mica, HOPG is non-polar and,for samples where elemental analysis is required, it provides a carbon-only background.
It consists of highly ordered planes of carbon atoms in (002) orientation and the quality of these parallel planes is defined by the mosaic spread angle.
The standard grade of HOPG has a mosaic angle of 3.5 1.5 , while substrates with more highly ordered planes, with mosaic angles of 0.8 0.2 and 0.4 0.1 , are also available.
Technical Note
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Download Technical Note |
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| AGG3389 | HOPG 3.5 1.5 Mosaic Spread 10mm x 10mm x 2mm |
Each | p.o.r. | ||
| AGG3389-1212 | HOPG 3.5 1.5 Mosaic Spread 12mm x 12mm x 2mm |
Each | p.o.r. | ||
| AGG3389-1717 | HOPG 3.5 1.5 Mosaic Spread 17mm x 17mm x 2mm |
Each | p.o.r. | ||
| AGG3046-55 | HOPG 0.8 0.2 Mosaic Spread 5mm x 5mm x 1mm |
Each | p.o.r. | ||
| AGG3045-55 | HOPG 0.4 0.1 Mosaic Spread 5mm x 5mm x 1mm |
Each | p.o.r. | ||
| AGG3045-1010 | HOPG 0.4 0.1 Mosaic Spread 10mm x 10mm x 1mm |
Each | p.o.r. |
This product is intended for checking the tip sharpness (not height calibration); AFM tips wear down and can get damaged resulting in blurry lines, especially at the nano scale. For example, a worn tip would have the cobalt particles looking oblong rather than round. The second feature of this product is in helping the microscopist get down to the nanoscale. having a uniform coverage of nanoscale features, you know what to look for and what to expect.
A single layer of cobalt particles provide an excellent and stable substrate for AFM tip characterization and instrument operation. Image at top demonstrates height calibration at 1nm (red line profile) and 3nm (green line profile) on the standard to indicate a sharp tip. Can be used in water as long as there are no chemicals present which would react with the substrate or the Co particles.
The Co particles are flattened half spheres (droplets) with the radius typically larger than the height. There is a distribution of particle heights between 1 and 5nm. The measured widths will largely depend on the size of the tip, however, they are round.
Available on 5x5mm silicon wafer chips, unmounted or mounted, on 12mm stainless steel metal disk. Tip characterization down to angstrom resolution is easily attained. Ready-to-scan test specimen.
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| 628 | PELCO AFM Tip and Resolution Test Specimen, Unmounted |
Each | € 189,10 | ||
| 628-AFM | PELCO AFM Tip and Resolution Test Specimen, Mount AFM |
Each | € 202,10 |
When imaging a sample by AFM, it is imperative to know the condition of the AFM probe, since this determines the quality and correctness of the image. The TipChecker is an SPM sample for fast, convenient and efficient determination of the AFM tip condition.
The clear differences between the tips becomes apparent even with a single scan line. The TipChecker offers a fast and easy way to compare and categorize different AFM tips with respect to tip apex, shape and sharpness. The TipChecker sample enables checking if the tip is still good, starts showing wear or is blunted or broken without the need for scanning an entire image or using SEM inspection.
The Tipchecker sample works perfectly with Auto Tip Qualification and Tip Characterization software that is available on the market.
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| Good Tip | Worn Tip | Blunt or Broken Tip |
Figures showing a comparison between different AFM probe tips used to image the TipChecker sample. Scan is 1×1 m for all images, height is 100nm. Each image is shown with a representative cross-section scan. Images made with TAP 300AL-G AFM Tip
The BudgetSensors TipChecker sample consists of an extremely wear-resistant thin film coating deposited on a silicon chip. The thin film coating shows a granular, sharply peaked nanostructure ideal for reversely imaging an AFM probe’s apex.
The die size of the BudgetSensors TipChecker is 5x5mm and is completely coated with the thin film. It comes glued onto a 12mm diameter, stainless steel, magnetic disc, ready to be placed into your AFM set.
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| TC1 | BudgetSensors TipChecker for AFM probes |
Each | € 382,00 |
Step heights of 20, 100 or 500nm.
The HS-series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z-axis calibration the standards also offer X- and Y-axis calibration for bigger scanners in the 40-100um range. The structure symmetry enables calibration without the need to rotate and re-align the sample in between x- and Y-axis calibration.
The HS-series feature silicon dioxide structure arrays on a 5x5mm silicon chip.
The fabrication process ensures excellent uniformity of the structures across the chip. There are three step heights available with nominal values of: 20nm, 100nm, and 500nm. The actual value will be supplied with the delivered calibration standard. Arrays of structures with different shape and pitch are integrated on the chip. The larger square of 1 x 1mm contains square pillars and holes with a 10um pitch. The smaller center square of 500 x 500 m contains circular pillars and holes as well as lines in both X- and Y-direction with a 5µm pitch.
HS-500MG – 3% height accuracy of the value that is handwritten on the label of the individual box.
HS-20MG – 2% height accuracy; 100 nanometer pitch (lateral) accuracy for all arrays
HS-100MG – 3% height accuracy; 100 nanometer pitch accuracy for all arrays
HS-500MG – 3% height accuracy; 100 nanometer pitch accuracy for all arrays
CS-20NG – 2% height accuracy; 100 nanometer pitch accuracy for the 5 micrometer and 10 micrometer pitch arrays, and 10 nanometer pitch accuracy for the 500 nanometer pitch array
The silicon chips are available unmounted or mounted on a 12mm standard AFM disc using a high quality electrically conductive epoxy.
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| HS-20MG | AFM Calibration Standard, step height 20nm, mounted |
Each | € 382,00 | ||
| HS-20MG-UM | AFM Calibration Standard, step height 20nm, unmounted |
Each | € 382,00 | ||
| HS-100MG | AFM Calibration Standard, step height 100nm, mounted |
Each | € 432,90 | ||
| HS-100MG-UM | AFM Calibration Standard, step height 100nm, unmounted |
Each | € 382,00 | ||
| HS-500MG | AFM Calibration Standard, step height 500nm, mounted |
Each | € 382,00 | ||
| HS-500MG-UM | AFM Calibration Standard, step height 500nm, unmounted |
Each | € 382,00 |
The CS-20NG represents an advanced XYZ calibration grid that enables reliable calibration of AFM systems down to the nanometer level.
The XYZ calibration standard features silicon dioxide structures on a 5x5mm silicon chip. The calibration area is in the middle of the chip and can be easily located by the optical system of the AFM. The structure step height is in the range of 20nm. The actual height value will be supplied with the delivered calibration standard.
CS-20NG has three different x-y array sizes, all with the same 20nm height. The large 1x1mm square contains square pillars and holes with a 10 m pitch. The middle square contains circular pillars, holes and lines with a 5 m pitch. The small central area contains circular holes with a 500nm pitch. The CS-20NG is suitable for both lateral and vertical AFM scanner calibration. The structure symmetry enables calibration in one step without the need to rotate the sample between X- and Y-calibration.
Vertical accuracy is 2% of the actual value which corresponds to 0.4nm. The lateral pitch accuracy for the 5 m and 10 m patterns is 0.1 m. For the 500nm pitch region, the lateral accuracy is 10nm.
The XYZ calibration standard is mounted on a 12mm, standard AFM disc using a high quality electrically conductive epoxy resin.
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| CS-20NG | AFM XYZ Calibration Standard, mounted on a 12mm AFM disk |
Each | € 1.338,40 |
