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Home / Accessories for Microscopy / Material Science / Polishing & Grinding / Tripod Polisher

Tripod Polisher

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Tripod Polisher

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590TEM, 590SEM, 590TS

Prepare TEM and SEM samples of pre-specified micron-sized regions

The PELCO® Tripod Polisher™ 590 was designed by researchers at the IBM East Fishkill Laboratory* to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions.

For TEM samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling.

Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals, and geological samples.

Features & Benefits

  • Precise cross-sectioning at the TEM level
  • Repeatable and rapid production of TEM samples
  • Reduces ion milling time to minutes as opposed to hours
  • Produces large thin areas over the entire specimen

Included Accessories per Kit

 

AccessoriesPELCO® Tripod Polisher™
590TEM

Prod. No. 59100
PELCO® Tripod Polisher™
590SEM

Prod. No. 59200
PELCO® Tripod Polisher™
590TS

Prod. No. 59300
59306Wedge Polishing Mount1–1
59307Slotted L-bracket111
59308Pyrex® Wedge Polishing Stub1–1
59310Pyrex® Insert Large1–1
59312Heater Block1–1
59313SEM Stub–44
59314Glass Leveling Slide222
59315Microscope Stand111
59316Delrin® Foot for Micrometer323
Operation - Standard Technique

The PELCO® Tripod Polisher™ 590 can be used to prepare a sample for both SEM and TEM cross-sectional analysis.

To accomplish this, the sample is mounted on the face of a special SEM stub which is clamped into the slotted L-bracket of the PELCO® Tripod Polisher™ 590. Initial grinding is done on a 15μm metal bonded diamond disc.

Further lapping and polishing continues with a succession of diamond films ranging in size from 30μm to 0.5μm.
The final polish is done with a colloidal silica suspension. As lapping progresses, the two rear micrometers are used to adjust the plane of polish.

With periodic examinations in an inverted microscope, the plane of polish is adjusted until it is parallel to the plane of interest.
At this point the SEM stub may be moved to an ion mill for a quick milling to remove fine scratches, polishing debris and to give the surface topography prior to SEM analysis.

The SEM stub can be mounted directly in the SEM for analysis. When analysis is complete, a TEM sample of the same area is made.

The sample is removed from the SEM stub and attached to a single aperture TEM grid. The slotted L-bracket is removed and the TEM grid is attached to the round sample mount which is affixed to the center of the polisher.
The sample is now mechanically thinned using Diamond Lapping Film.

During this process the sample is periodically examined in an inverted microscope and the micrometers are adjusted to maintain the correct plane of polish. The sample is FINAL polished to 1μm or less and then ion milled for up to 15 minutes.

Operation - Wedge Technique

The preferential thinning and surface topography that occurs in briefly ion milled samples makes the study of interfaces between dissimilar materials difficult.

These problems can be reduced by completely eliminating the ion milling step and mechanically polishing the sample to electron transparency by employing the wedge technique.

With this technique the SEM stub is replaced, in the slotted L-bracket, with a Pyrex® insert. The sample is mounted on the face of this insert.

After the plane of interest is obtained, the sample is removed and mounted on the bottom of the Pyrex® insert.
The two rear micrometers are adjusted and the micrometer nearest the sample is retracted to produce a wedge shape as material is removed from the sample.

The sample, with the features of interest at the apex of the wedge, is thinned from the back side until the edge of interest is ~1μm thick. The sample is then polished on a final polishing cloth such as our MultiTex Cloth (product number 816-12) with a colloidal silica suspension until thickness fringes are visible (below a few thousand angstroms).

The sample is then removed from the Pyrex® insert and attached to a single aperture TEM grid for analysis.

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Product
Description
Order
Product

Tripod Polisher 590TEM
Base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590TEM accessories
no. 59100

Description

NEW PELCO Tripod Polisher 590TEM precision sample thinning for TEM

Includes: Base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590TEM accessories listed

Order

Art.Description Unit PriceQuantity
59100

ELCO Tripod Polisher™ 590TEM precision sample thinning for TEM

Each € 1.642,30
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Brand: Ted Pella

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Description
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Product

Tripod Polisher™ 590SEM
Base with 2 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590SEM accessories
no. 59200

Description

PELCO Tripod Polisher 590SEM precision sample preparation for SEM

Includes: Base with 2 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590SEM accessories

Order

Art.Description Unit PriceQuantity
59200

PELCO Tripod Polisher™ 590SEM precision sample preparation for SEM

Each € 1.240,60
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Brand: Ted Pella

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Description
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Product

Tripod Polisher™ 590TS
Base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590TS accessories
no. 59300

Description

PELCO Tripod Polisher 590TS configured for SEM and TEM sample preparation

Includes: Base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590TS accessories

Order

Art.Description Unit PriceQuantity
59300

PELCO Tripod Polisher™ 590TS configured for SEM and TEM sample preparation

Each € 2.038,10
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PELCO Tripod Polisher 590 Starter Kit
no. 59350

Description

PELCO Tripod Polisher 590 Starter Kit

Includes one each of the items listed below:

Art. # Description Qty
814-457 30?m Diamond Film, 8″, PB each
814-456 15?m Diamond Film, 8″, PB each
814-454 6?m Diamond Film, 8″, PB each
814-452 1?m Diamond Film, 8″, PB each
814-451 0.5?m Diamond Film, 8″, PB each
816-12 MultiTex Cloth, 8″, PSA, pkg/10 each
59317 Glass Plate, 8″ x 0.25″ each
815-120 0.05?m Colloidal Silica, 160z. each
892-45 Mounting Wax, 135 each
1GC450 Slotted TEM Grids, pkg/100 each
17395 Sample Cleaner, 4oz. each
80915 Cotton Swabs, pkg/50 each
14005 Petri Dish each
14012 Filter Paper each
5398 Tweezer Set each
80932 3M Scotch Pad each
81450 Squeegee each
Order

Art.Description Unit PriceQuantity
59350

PELCO Tripod Polisher™ 590 Starter Kit

Each € 903,30
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Replacements

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Wedge Polishing Mount
Includes one 59311 Wedge Polishing Clamp and five 59309 Pyrex Wedge Polishing Rods
no. 59306

Order

Art.Description Unit PriceQuantity
59306

Wedge Polishing Mount

Each € 189,10
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Slotted L-bracket
Used with 59311 Wedge Polishing Clamp and 59313 SEM Stub
no. 59307

Order

Art.Description Unit PriceQuantity
59307

Slotted L-bracket

Each € 241,20
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Brand: Ted Pella

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Pyrex Wedge Polishing Stub
Used with 59311 Wedge Polishing Clamp
no. 59308

Order

Art.Description Unit PriceQuantity
59308

Pyrex Wedge Polishing Stub

Each € 25,00
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Brand: Ted Pella

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Pyrex Insert Large
Used with 59307 Slotted L-bracket
no. 59310

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Art.Description Unit PriceQuantity
59310

Pyrex Insert Large

Each € 47,80
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Heater Block
Used with 59307 Slotted L-bracket
no. 59312

Order

Art.Description Unit PriceQuantity
59312

Heater Block

Each € 90,10
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Brand: Ted Pella

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SEM Stub
Used with 59307 Slotted L-bracket
no. 59313

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Art.Description Unit PriceQuantity
59313

SEM Stub

Each € 90,10
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Brand: Ted Pella

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Glass Leveling Slide
no. 59314

Order

Art.Description Unit PriceQuantity
59314

Glass Leveling Slide

Each € 8,80
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Brand: Ted Pella

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Microscope Stand
no. 59315

Order

Art.Description Unit PriceQuantity
59315

Microscope Stand

Each € 90,10
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Brand: Ted Pella

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Delrin Foot for Micrometer Assembly
no. 59316

Order

Art.Description Unit PriceQuantity
59316

Delrin Foot for Micrometer Assembly

Each € 27,90
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Brand: Ted Pella

Optional Accessories

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Parallel Polishing Mount with Pyrex Insert
Used with basic tripod base
no. 59301

Order

Art.Description Unit PriceQuantity
59301

Parallel Polishing Mount with Pyrex Insert

Each € 99,80
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Brand: Ted Pella

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Parallel Polishing Mount 1.25? dia. Stainless Steel
Used with basic tripod base
no. 59302

Order

Art.Description Unit PriceQuantity
59302

Parallel Polishing Mount 1.25? dia. Stainless Steel

Each € 60,20
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Brand: Ted Pella

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Planarizing Tool, for feet resurfacing
no. 59303

Order

Art.Description Unit PriceQuantity
59303

Planarizing Tool, for feet resurfacing

Each € 294,70
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Brand: Ted Pella

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X-Section L-bracket Assembly
no. 59304

Order

Art.Description Unit PriceQuantity
59304

X-Section L-bracket Assembly

Each € 202,10
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Brand: Ted Pella

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Pyrex Wedge Polishing Rod
Used with 59311 Wedge Polishing Clamp
no. 59309

Order

Art.Description Unit PriceQuantity
59309

Pyrex Wedge Polishing Rod

Each € 63,80
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Brand: Ted Pella

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Wedge Polishing Clamp
Used with 59307 Slotted L-bracket
no. 59311

Order

Art.Description Unit PriceQuantity
59311

Wedge Polishing Clamp

Each € 77,80
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Brand: Ted Pella

Contact

Van Loenen Instruments
Penningweg 69 E
1507 DE Zaandam

Tel :+31 75 614 90 40
E-mail  :info@loeneninstruments.com

BTW/VAT nr. :NL804 608 180 B01
KvK nr. :28038099

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