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Pelcotec LMS-20G Magnification Calibration Standard
The Pelcotec LMS-20G calibration standard for transmitted light microscopy
no. 688-2and 688-22

Description

Pelcotec LMS-20G Magnification Calibration Standard

Large area, resolution 0.01mm

The Pelcotec LMS-20G calibration standard for transmitted light microscopy has been designed for precise magnification calibration and microscope stage calibration.
The 20 x10mm pattern is fabricated with Cr lines on clear soda lime glass.
The glass is fitted in a black metal slide.

Useful in the 5x to 1000x magnification range.

Specifications are:

  • Total calibration area is 20 x 10mm with crossed lines and 0.01mm divisions
  • 75nm Cr lines on clear soda lime g
  • Cross hairs showed on every 0.1mm with larger cross hairs at 0.5 and 1mm over the complete area
  • Glass thickness 550 m 50 m
  • Glass mounted in black metal slide, 76.2×25.4×1.6mm
  • Individual serial number on each Pelcotec LMS-20G calibration standard
  • NIST Traceable version is Pelcotec LMS-20GT (batch level certificate provided)
  • Individually certified version is Pelcotec LMS-20GC (individual certificate included)

 

Download Technical Note
Order

Art.Description Unit PriceQuantity
688-2

Pelcotec™ LMS-20GT, Magnification Calibration standard, Transmitted Light, Traceable, in 3″x 1″ metal slide

 Each € 397,30
✓
688-22

Pelcotec™ LMS-20GC, Magnification Calibration standard, Transmitted Light, Certified, in 3″x 1″ metal slide

 Each € 1.002,50
✓
Brand:

Product

Pelcotec LMS-20 Low Magnification Calibration Standard
The Pelcotec LMS-20 Calibration Standard has been specifically designed for precise low magnification calibration and specimen stage calibration.
no. 688-1 to 688-1S

Description

Pelcotec LMS-20 Low Magnification Calibration Standard

The Pelcotec LMS-20 Calibration Standard has been specifically designed for precise low magnification calibration and specimen stage calibration.

Useful for large area particle analysis, GSR analysis, low magnification SEM applications, and LM applications with reflected light.
Useful in the 5x to 1000x magnification range.

Specifications are:

  • Total calibration area is 20 x 10mm with crossed lines and 0.01mm divisions
  • 75nm Cr lines on ultra-flat silicon substrate
  • Cross hairs showed at every 0.1mm with larger cross hairs at 0.5 and 1mm over the complete area
  • Serial number etched on each Pelcotec LMS-20 calibration standard
  • NIST traceable version is Pelcotec LMS-20T (batch level certificate provided)
  • Individually fully certified version is Pelcotec LMS-20C (individual certificate included)
  • Si die size is 22 x 11mm with a thickness of 675 m +/- 10 m, <100> orientation
  • Boron doped silicon wafer with a resistivity of 5-10 Ohm/cm
  • Available unmounted or mounted on larger SEM specimen mounts

 

To avoid contamination of test and calibration samples, we recommend storing these under vacuum. For the SEM pin mount, the #16179 PELCO SEM Sample Stub Vacuum Desiccator would be ideal.

Also available for transmitted light microscopy as LMS-20G

Sample Certificate of Traceability

688-1 LMS-20T Sample Certificate of Traceability

SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
688-1

Pelcotec™ LMS-20T, Low-Mag Calibration Standard, Traceable, Unmounted

 Each € 226,50
✓
688-1G

Pelcotec™ LMS-20T, Low-Mag Calibration Standard, Traceable, Mount G, you supply mount

 Each p.o.r.
688-1L

Pelcotec™ LMS-20T, Low-Mag Calibration Standard, Traceable, Mount L

 Each € 241,20
✓
688-1O

Pelcotec™ LMS-20T, Low-Mag Calibration Standard, Traceable, Mount O

 Each € 241,20
✓
688-1Q

Pelcotec™ LMS-20T, Low-Mag Calibration Standard, Traceable, Mount Q

 Each € 241,20
✓
688-1R

Pelcotec™ LMS-20T, Low-Mag Calibration Standard, Traceable, Mount R

 Each € 241,20
✓
688-1S

Pelcotec™ LMS-20T, Low-Mag Calibration Standard, Traceable, Mounted on 25x75mm slide

 Each € 241,20
✓
Brand:

Product

Pelcotec LMS-20C, Low Magnification Calibration Standard, Certified
The Pelcotec LMS-20 Calibration Standard has been specifically designed for precise low magnification calibration and specimen stage calibration.
no. 688-11 to 688-11S

Description

Pelcotec LMS-20 Low Magnification Calibration Standard

The Pelcotec LMS-20 Calibration Standard has been specifically designed for precise low magnification calibration and specimen stage calibration.

Useful for large area particle analysis, GSR analysis, low magnification SEM applications, and LM applications with reflected light.
Useful in the 5x to 1000x magnification range.

Specifications are:

  • Total calibration area is 20 x 10mm with crossed lines and 0.01mm divisions
  • 75nm Cr lines on ultra-flat silicon substrate
  • Cross hairs showed at every 0.1mm with larger cross hairs at 0.5 and 1mm over the complete area
  • Serial number etched on each Pelcotec LMS-20 calibration standard
  • NIST traceable version is Pelcotec LMS-20T (batch level certificate provided)
  • Individually fully certified version is Pelcotec LMS-20C (individual certificate included)
  • Si die size is 22 x 11mm with a thickness of 675 m +/- 10 m, <100> orientation
  • Boron doped silicon wafer with a resistivity of 5-10 Ohm/cm
  • Available unmounted or mounted on larger SEM specimen mounts

To avoid contamination of test and calibration samples, we recommend storing these under vacuum. For the SEM pin mount, the #16179 PELCO SEM Sample Stub Vacuum Desiccator would be ideal.

Also available for transmitted light microscopy as LMS-20G

Sample Certificate of Traceability

688-11 LMS-20C Sample Certificate

 

SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
688-11

Pelcotec™ LMS-20C, Low-Mag Calibration Standard, Certified Unmounted

 Each € 829,90
✓
688-11G

Pelcotec™ LMS-20C, Low-Mag Calibration Standard, Certified, Mount G, you supply mount

 Each p.o.r.
688-11L

Pelcotec™ LMS-20C, Low-Mag Calibration Standard, Certified, Mount L

 Each € 856,60
✓
688-11O

Pelcotec™ LMS-20C, Low-Mag Calibration Standard, Certified, Mount O

 Each € 856,60
✓
688-11Q

Pelcotec™ LMS-20C, Low-Mag Calibration Standard, Certified, Mount Q

 Each € 856,60
✓
688-11R

Pelcotec™ LMS-20C, Low-Mag Calibration Standard, Certified, Mount R

 Each € 856,60
✓
688-11S

Pelcotec™ LMS-20C, Low-Mag Calibration Standard, Certified, Mounted on 25x75mm slide

 Each € 856,60
✓
Brand:

Product

Pelcotec G-1 Silicon Calibration Specimen – 1 m Pitch
The Pelcotec G-1 calibration specimen with a 1 m pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range.
no. 633-1 to 633-1S

Description

Pelcotec G-1 Silicon Calibration Specimen – 1 m Pitch

Includes 1 m, 10 m and 100 m pitch

The Pelcotec G-1 calibration specimen with a 1 m pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range.
Can be used for SEM, Auger, Sims, FIB, and LM (reflected light).
Specimen may also be mounted directly on the Pelcotec G-1 which will give an accurate internal calibration in the image.

Particularly useful when working with powders.
Possible alternative for the SIRA calbration specimen (0.462 m pitch) which is no longer available.

The Pelcotec G-1 has the following specifications:

  • Total calibration area is 3x3mm with a 1 m pitch grid
  • Lines at 10um and 100um are thicker for easy orientation
  • Includes 1 m, 10 m and 100 m pitch
  • 300nm +/- 30nm deep line etched in ultraflat Si
  • Line width is 200nm at 1 m, 300nm at 10 m and 400nm at 100 m pitch lines
  • Precision is 1 m +/- 0.025 m with a perpendicularity better than 0.01
  • Serial number etched on each Pelcotec G-1 calibration standard
  • NIST traceable version is Pelcotec G-1T
  • Individually fully certified version is Pelcotec G-1C
  • Si die size is 4x4mm with a thickness of 525 m +/-20 m, <100> orientation
  • Boron doped silicon wafer with a resistivity of 5-10 Ohm/cm
  • Available unmounted or mounted on SEM specimen mounts

To avoid contamination of test and calibration samples, we recommend storing these under vacuum.

 

SEM Image Shows 1 m Pitch10 m Pitch Lines1 m Pitch Lines
Download 633-1 Sample Certificate of Traceability
SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
633-1

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Unmounted

 Each € 136,40
✓
633-1A

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount A

 Each € 152,40
✓
633-1B

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount B

 Each € 152,40
✓
633-1C

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount C

 Each € 152,40
✓
633-1D

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount D

 Each € 152,40
✓
633-1E

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount E

 Each € 152,40
✓
633-1F

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount F

 Each € 152,40
✓
633-1G

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount G, you supply mount

 Each p.o.r.
633-1K

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount K

 Each € 152,40
✓
633-1L

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount L

 Each € 152,40
✓
633-1M

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount M

 Each € 152,40
✓
633-1O

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount O

 Each € 152,40
✓
633-1P

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount P

 Each € 152,40
✓
633-1Q

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount Q

 Each € 152,40
✓
633-1R

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mount R

 Each € 152,40
✓
633-1S

Pelcotec™ G-1T, 1 m Grid Calibration Standard, Traceable, Mounted on 25x75mm slide

 Each € 152,40
✓
Brand:

Product

Pelcotec G-1 Silicon Calibration Specimen – 1 µm Pitch, Certified
The Pelcotec G-1 calibration specimen with a 1 µm pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range.
no. 633-11 to 633-11S

Description

Pelcotec G-1 Silicon Calibration Specimen – 1 µm Pitch

Includes 1 m, 10 µm and 100 µm pitch

The Pelcotec G-1 calibration specimen with a 1 m pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range.
Can be used for SEM, Auger, Sims, FIB, and LM (reflected light).
Specimen may also be mounted directly on the Pelcotec G-1 which will give an accurate internal calibration in the image.

Particularly useful when working with powders.
Possible alternative for the SIRA calbration specimen (0.462 µm pitch) which is no longer available.

The Pelcotec G-1 has the following specifications:

  • Total calibration area is 3x3mm with a 1 µm pitch grid
  • Lines at 10um and 100um are thicker for easy orientation
  • Includes 1 µm, 10 µm and 100 µm pitch
  • 300nm +/- 30nm deep line etched in ultraflat Si
  • Line width is 200nm at 1 m, 300nm at 10 m and 400nm at 100 m pitch lines
  • Precision is 1 m +/- 0.025 m with a perpendicularity better than 0.01
  • Serial number etched on each Pelcotec G-1 calibration standard
  • NIST traceable version is Pelcotec G-1T
  • Individually fully certified version is Pelcotec G-1C
  • Si die size is 4x4mm with a thickness of 525 m +/-20 m, <100> orientation
  • Boron doped silicon wafer with a resistivity of 5-10 Ohm/cm
  • Available unmounted or mounted on SEM specimen mounts

To avoid contamination of test and calibration samples, we recommend storing these under vacuum.

 

SEM Image Shows 1 m Pitch10 m Pitch Lines1 m Pitch Lines
Download 633-11 Sample Certificate of Calibration
SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
633-11

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Unmounted

 Each € 744,00
✓
633-11A

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount A

 Each € 739,10
✓
633-11B

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount B

 Each € 739,10
✓
633-11C

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount C

 Each € 739,10
✓
633-11D

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount D

 Each € 739,10
✓
633-11E

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount E

 Each € 739,10
✓
633-11F

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount F

 Each € 739,10
✓
633-11G

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount G, you supply mount

 Each p.o.r.
633-11K

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount K

 Each € 739,10
✓
633-11L

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount L

 Each € 739,10
✓
633-11M

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount M

 Each € 739,10
✓
633-11O

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount O

 Each € 739,10
✓
633-11P

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount P

 Each € 739,10
✓
633-11Q

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount Q

 Each € 739,10
✓
633-11R

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mount R

 Each € 739,10
✓
633-11S

Pelcotec™ G-1C, 1 m Grid Calibration Standard, Certified, Mounted on 25x75mm slide

 Each € 739,10
✓
Brand:

Product

Planotec Silicon Calibration Specimen – 10 m Pitch
Useful for magnification calibration or image distortion check in SEM and LM.
no. 615 to 615-5

Description

Planotec Silicon Calibration Specimen – 10 m Pitch

Useful for magnification calibration or image distortion check in SEM and LM.

Single crystal silicon, 5mm x 5mm.
The squares repeat every 10 m (0.01mm).
The dividing lines are about 1.9 m wide, formed by electron beam lithography.

A broader marking line is written every 500 m (0.5mm) which is useful for light microscopy.
Lines are etched, and approximately 300nm deep.
Available unmounted or mounted on SEM specimen mounts.

A certificate of calibration can be supplied for the Silicon Test Specimen at extra cost.

Many types of samples can be mounted directly onto the Silicon Test Specimen so that an internal calibration is obtained in the image.

  • Thickness: 675 m
  • Si crystal orientation: <100>
  • Wafer type: P-type/boron doped
  • Resistance: 1-30 Ohm/cm

To avoid contamination of test and calibration samples, we recommend storing these under vacuum.

SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
615

Planotec Silicon Test Specimen, Unmounted

 Each € 110,10
✓
615-A

Planotec Silicon Test Specimen, Mount A

 Each € 136,90
✓
615-B

Planotec Silicon Test Specimen, Mount B

 Each € 136,90
✓
615-C

Planotec Silicon Test Specimen, Mount C

 Each € 136,90
✓
615-D

Planotec Silicon Test Specimen, Mount D

 Each € 136,90
✓
615-E

Planotec Silicon Test Specimen, Mount E

 Each € 136,90
✓
615-F

Planotec Silicon Test Specimen, Mount F

 Each € 136,90
✓
615-G

Planotec Silicon Test Specimen, Mount G, you supply mount

 Each p.o.r.
615-K

Planotec Silicon Test Specimen, Mount K

 Each € 136,90
✓
615-L

Planotec Silicon Test Specimen, Mount L

 Each € 136,90
✓
615-M

Planotec Silicon Test Specimen, Mount M

 Each € 136,90
✓
615-O

Planotec Silicon Test Specimen, Mount O

 Each € 136,90
✓
615-P

Planotec Silicon Test Specimen, Mount P

 Each € 136,90
✓
615-Q

Planotec Silicon Test Specimen, Mount Q

 Each € 136,90
✓
615-R

Planotec SiliconTest Specimen, Mount R

 Each € 138,30
✓
615-5

Planotec Test Specimen for incident light microscopy, Mounted on a blackened glass slide

 Each € 564,60
✓
Brand:

Product

Planotec Silicon Calibration Specimen – 10 m Pitch, Certified
Useful for magnification calibration or image distortion check in SEM and LM.
no. 660-615-A to 660-615-5

Description

Planotec Silicon Calibration Specimen – 10 m Pitch

Useful for magnification calibration or image distortion check in SEM and LM.

Single crystal silicon, 5mm x 5mm.
The squares repeat every 10 m (0.01mm).
The dividing lines are about 1.9 m wide, formed by electron beam lithography.

A broader marking line is written every 500 m (0.5mm) which is useful for light microscopy.
Lines are etched, and approximately 300nm deep.
Available unmounted or mounted on SEM specimen mounts.

A certificate of calibration can be supplied for the Silicon Test Specimen at extra cost.

Many types of samples can be mounted directly onto the Silicon Test Specimen so that an internal calibration is obtained in the image.

  • Thickness: 675 m
  • Si crystal orientation: <100>
  • Wafer type: P-type/boron doped
  • Resistance: 1-30 Ohm/cm

To avoid contamination of test and calibration samples, we recommend storing these under vacuum.

Download Sample Certification for Planotec Test Specimen
SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
660-615-A

Planotec Silicon Test Specimen, Certified, Mount A

 Each € 1.086,60
✓
660-615-B

Planotec SiliconTest Specimen, Certified, Mount B

 Each € 1.024,80
✓
660-615-C

Planotec Silicon Test Specimen, Certified, Mount C

 Each € 1.024,80
✓
660-615-D

Planotec Silicon Test Specimen, Certified, Mount D

 Each € 2.212,30
✓
660-615-E

Planotec Silicon Test Specimen, Certified, Mount E

 Each € 1.024,80
✓
660-615-F

Planotec Silicon Test Specimen, Certified, Mount F

 Each € 952,30
✓
660-615-G

Planotec Silicon Test Specimen, Certified, Mount G, you supply mount

 Each € 1.155,70
✓
660-615-K

Planotec Silicon Test Specimen, Certified, Mount K

 Each € 1.004,30
✓
660-615-L

Planotec Silicon Test Specimen, Certified, Mount L

 Each € 1.684,50
✓
660-615-M

Planotec Silicon Test Specimen, Certified, Mount M

 Each € 1.031,00
✓
660-615-O

Planotec Silicon Test Specimen, Certified, Mount O

 Each € 1.031,00
✓
660-615-P

Planotec Silicon Test Specimen, Certified, Mount P

 Each € 1.031,00
✓
660-615-Q

Planotec Silicon Test Specimen, Certified, Mount Q

 Each € 986,60
✓
660-615-R

Planotec Silicon Test Specimen, Certified, Mount R

 Each € 1.031,00
✓
660-615-5

Planotec Test Specimen for incident light microscopy, Certified, Mounted on a blackened glass slide

 Each € 1.105,10
✓
Brand:

Product

Low Magnification Calibration Ruler
100 markings, divisions 0.01mm on disc
no. 630 to 630-R

Description

Low Magnification Calibration Ruler

100 markings, divisions 0.01mm on disc

Calibration ruler on 1/8″ (3.2mm) nickel-plated copper disc. 1mm long scale with 100 markings, with 0.01mm divisions with an accuracy of +/- 0.0005mm or better.

Available unmounted, or mounted on SEM mounts.

Order

Art.Description Unit PriceQuantity
630

Lo-mag Calibration Disc, Unmounted

 Each € 139,50
✓
630-A

Lo-mag Calibration Disc, Mount A

 Each € 152,40
✓
630-B

Lo-mag Calibration Disc, Mount B

 Each € 152,40
✓
630-C

Lo-mag Calibration Disc, Mount C

 Each € 152,40
✓
630-D

Lo-mag Calibration Disc, Mount D

 Each € 152,40
✓
630-E

Lo-mag Calibration Disc, Mount E

 Each € 152,40
✓
630-F

Lo-mag Calibration Disc, Mount F

 Each € 152,40
✓
630-G

Lo-mag Calibration Disc, Mount G, You Supply Mount

 Each p.o.r.
630-K

Lo-mag Calibration Disc, Mount K

 Each € 152,40
✓
630-L

Lo-mag Calibration Disc, Mount L

 Each € 152,40
✓
630-M

Lo-mag Calibration Disc, Mount M

 Each € 152,40
✓
630-O

Lo-mag Calibration Disc, Mount O

 Each € 152,40
✓
630-P

Lo-mag Calibration Disc, Mount P

 Each € 152,40
✓
630-Q

Lo-mag Calibration Disc, Mount Q

 Each € 152,40
✓
630-R

Lo-mag Calibration Disc, Mount R

 Each € 152,40
✓
Brand:

Product

500nm SEM Cross Line Grating Replica
500nm cross line grating carbon replica (waffle pattern) with Au/Pd shadowing.
no. 674 to 674-R

Description

500nm SEM Cross Line Grating Replica

500nm cross line grating carbon replica (waffle pattern) with Au/Pd shadowing.
Replica is mounted on a 400 mesh copper TEM grid with a diameter of 3mm.

This cross line replica has well-defined trench type grooves, which makes it easy to determine the 500nm pitch or the 2,000 lines per millimeter.

Available as unmounted standard or mounted on a SEM mount.

See our #253 Magnification Calibration slide-rule for quick assistance in obtaining magnification based on space counts of this product.

SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
674

SEM Grating Replica, 500nm, Unmounted

 Each € 72,60
✓
674-A

SEM Grating Replica, 500nm, Mount A

 Each € 81,40
✓
674-B

SEM Grating Replica, 500nm, Mount B

 Each € 81,40
✓
674-C

SEM Grating Replica, 500nm, Mount C

 Each € 81,40
✓
674-D

SEM Grating Replica, 500nm, Mount D

 Each € 81,40
✓
674-E

SEM Grating Replica, 500nm, Mount E

 Each € 81,40
✓
674-F

SEM Grating Replica, 500nm, Mount F

 Each € 81,40
✓
674-G

SEM Grating Replica, 500nm, Mount G, You Supply Mount

 Each p.o.r.
674-K

SEM Grating Replica, 500nm, Mount K

 Each € 81,40
✓
674-L

SEM Grating Replica, 500nm, Mount L

 Each € 81,40
✓
674-M

SEM Grating Replica, 500nm, Mount M

 Each € 81,40
✓
674-O

SEM Grating Replica, 500nm, Mount O

 Each € 81,40
✓
674-P

SEM Grating Replica, 500nm, Mount P

 Each € 81,40
✓
674-Q

SEM Grating Replica, 500nm, Mount Q

 Each € 81,40
✓
674-R

SEM Grating Replica, 500nm, Mount R

 Each € 81,40
✓
Brand:

Product

Grating Replica, Waffle
Carbon replica with Au/Pd shadowing with 2,160 lines per millimeter.
no. 604 to 604-R

Description

Grating Replica, Waffle

(Crossed-Lines)

Carbon replica with Au/Pd shadowing with 2,160 lines per millimeter.
Replica is mounted on a 400 mesh copper TEM grid with a diameter of 3mm.

See our number 252 Magnification Calibration Slide-Rule for quick assistance in obtaining magnification based on space counts of this product.

SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
604

SEM Grating Replica, Unmounted

 Each € 79,10
✓
604-A

SEM Grating Replica, Mount A

 Each € 87,30
✓
604-B

SEM Grating Replica, Mount B

 Each € 87,30
✓
604-C

SEM Grating Replica, Mount C

 Each € 87,30
✓
604-D

SEM Grating Replica, Mount D

 Each € 87,30
✓
604-E

SEM Grating Replica, Mount E

 Each € 87,30
✓
604-F

SEM Grating Replica, Mount F

 Each € 87,30
✓
604-G

SEM Grating Replica, Mount G, you supply mount

 Each p.o.r.
604-K

SEM Grating Replica, Mount K

 Each € 87,30
✓
604-L

SEM Grating Replica, Mount L

 Each € 87,30
✓
604-M

SEM Grating Replica, Mount M

 Each € 87,30
✓
604-O

SEM Grating Replica, Mount O

 Each € 87,30
✓
604-P

SEM Grating Replica, Mount P

 Each € 87,30
✓
604-Q

SEM Grating Replica, Mount Q

 Each € 87,30
✓
604-R

SEM Grating Replica, Mount R

 Each € 87,30
✓
Brand:

Product

Fine Copper Mesh Grids in Folding Grids (unmounted)
For low magnification calibration of scanning electron microscopes.
no. 631-A

Description

Fine Copper Mesh Grids in Folding Grids (unmounted)

For low magnification calibration of scanning electron microscopes.
The fine mesh is held within a 3mm 100 mesh folding grid.

Available with 1000 mesh (25.4 m pitch).

Order

Art.Description Unit PriceQuantity
631-A

1000 mesh in 3mm 100 mesh Folding Grid

 Each € 74,40
✓
Brand: