Silicon Contact AFM Probes |
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Cantilever lengths: 100 µm and 200 µm Coating: 70 nm thick Chromium/Gold. |
SiN (Si3N4) probes feature 4 cantilevers per chip. The cantilever's low force constants make these probes ideal for very soft contact mode imaging.
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 The AFM Holder Chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
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The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13 deg.) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep)