SMAL is the world’s first wide-field optical imaging technology that allows for the resolving of structures in super resolution, that is beyond the 200 nm diffraction limit.
Because SMAL imaging is optical, it has all the advantages of optical microscopy combined with super-resolution and the custom software suite.

SMAL is the world’s most powerful objective lens with a magnification factor of x400. This gives SMAL an optical resolving limit of 50 – 90 nm depending upon the sample.

This level of magnification and resolving limit is unique to purely optical microscopy; there is no other system on the market that provides the level of detail without resorting to non-optical techniques (STORM, STED, SEM etc.).

SMAL is the world’s first super-resolution technique that images in full, real colour. The colour that you see on SEM images is added to make images look more interesting.
With SMAL, colour gives a new source of super-resolution information. For example, with the graphene sample the colour of the flakes allows us to determine the thickness and quality of the graphene sample.

SMAL, unlike an SEM, does not just image the surface of a sample. It can image though areas of transparency, as it has a high focal depth, revealing multiple layers of a sample such as the Apple A4 processor shown on the left.

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Apple A4 processor

Ease of Use:.

SMAL is as simple to use as a regular wide-field optical microscope and can be operated by an undergraduate student with little to no training.
Simple to find focus and begin wide area scans with the x400 lens using standard optical techniques (200 microns²+ imaging area).

No complicated sample preparation so imaging can be carried out rapidly with no damage to the sample.

No environmental conditions needed – can image samples in a well-lit or dark room on a standard optical table.

Direct, non-intrusive and rapid observation - no need for vacuum, extended sample preparation avoided, no destruction of material, limited amount of sample required and SMAL can image non-conductive samples with no need for sputtering or sample coating

Specifications:

Stage

Active axes: X, Y, Z
Integrated sensor: Capacitive
Travel range (nm) : 200 x 200 x 200
Resolution (nm) : <1
Maximum load (kg) : 0.5
Interface: USB
Software with stitching and distortion correction

Graphene sample
The colour of the flakes allows us to determine the thickness and quality of the graphene sample.

Manual stage:

Travel Range (mm) : 13

SMAL x400 objective lens:

Super-Resolution Microsphere Amplifying Lens
Resolving limit of 50 – 90 nm sample dependant
Working distance 1-2 μ
Turret support 4 objectives

8.8MP CMOS Camera

Resolution: 4096 x 2160
Frame rate: 21 FPS
Sensor name and type: Sony IMX121
Quantum Efficiency Blue (% at 470 nm): 63
Quantum Efficiency Green (% at 525 nm): 73
Quantum Efficiency Red (% at 640 nm): 49
Temporal dark noise: 3.06
Saturation capacity: 5966
Dynamic range (dB): 64.49
Exposure range: 0.021 ms to 1 second
Interface: USB 3.1 Gen 1

Illumination:

Colour: neutral white LED
Correlated Colour Temperature: 4900 K
Bandwidth (FWHM) N/A
Viewing Angle: 150 °
Emitter Size: 1 mm x 1 mm
Maximum Current (CW): 1225 mA
Electrical Power: 3553 mW
Typical Lifetime: >10 000 h
Operating Temperature: 0 to 40 °C
Storage Temperature: -40 to 70 °C