When imaging a sample by AFM, it is imperative to know the condition of the AFM probe, since this determines the quality and correctness of the image. The TipChecker is an SPM sample for fast, convenient and efficient determination of the AFM tip condition.

The clear differences between the tips becomes apparent even with a single scan line. The TipChecker offers a fast and easy way to compare and categorize different AFM tips with respect to tip apex, shape and sharpness. The TipChecker sample enables checking if the tip is still good, starts showing wear or is blunted or broken without the need for scanning an entire image or using SEM inspection.

The Tipchecker sample works perfectly with Auto Tip Qualification and Tip Characterization software that is available on the market.

Good Tip	Worn Tip	Blunt or Broken Tip

Figures showing a comparison between different AFM probe tips used to image the TipChecker sample. Scan is 1×1 m for all images, height is 100nm. Each image is shown with a representative cross-section scan. Images made with TAP 300AL-G AFM Tip

The BudgetSensors TipChecker sample consists of an extremely wear-resistant thin film coating deposited on a silicon chip. The thin film coating shows a granular, sharply peaked nanostructure ideal for reversely imaging an AFM probe’s apex.

The die size of the BudgetSensors TipChecker is 5x5mm and is completely coated with the thin film. It comes glued onto a 12mm diameter, stainless steel, magnetic disc, ready to be placed into your AFM set.