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Home / Accessories for Microscopy / Nanotechnology / Calibration / SEM Calibration / Line - Grid Standards / Planotec Silicon Calibration Specimen – 10 m Pitch, Certified
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SEM Holders
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Product

Planotec Silicon Calibration Specimen – 10 m Pitch, Certified
Useful for magnification calibration or image distortion check in SEM and LM.
no. 660-615-A to 660-615-5

Description

Planotec Silicon Calibration Specimen – 10 m Pitch

Useful for magnification calibration or image distortion check in SEM and LM.

Single crystal silicon, 5mm x 5mm.
The squares repeat every 10 m (0.01mm).
The dividing lines are about 1.9 m wide, formed by electron beam lithography.

A broader marking line is written every 500 m (0.5mm) which is useful for light microscopy.
Lines are etched, and approximately 300nm deep.
Available unmounted or mounted on SEM specimen mounts.

A certificate of calibration can be supplied for the Silicon Test Specimen at extra cost.

Many types of samples can be mounted directly onto the Silicon Test Specimen so that an internal calibration is obtained in the image.

  • Thickness: 675 m
  • Si crystal orientation: <100>
  • Wafer type: P-type/boron doped
  • Resistance: 1-30 Ohm/cm

To avoid contamination of test and calibration samples, we recommend storing these under vacuum.

Download Sample Certification for Planotec Test Specimen
SEM Holders

SEM Holders

TypeProd. No.Data (D=Head dia.; P=Pin dia.; PL=Pin (length)
A16111pin mount dimPin Mount: D=12.7mm; P=3.2mm; PL= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
B16261pin mountPin Mount: D=12.7mm; P=3.2mm; PL=14.3mm, AMRAY
C1622110mm cylinder9.5mm dia. x 9.5mm Cylinder, JEOL
D1628115mm cylinder15mm dia. x 15mm Cylinder, JEOL, ISI/ABT/TOPCON
E16291cylinder mount15mm dia. x 10mm Cylinder, JEOL, ISI/ABT/TOPCON
F16111-9Pin Mount: 12.7mm x 3.2mm pin. PL=6mm, ZEISS/LEO SEMS FESEMs/FIBS
GYou Supply Mount or Mount of Your Choice, not listed here (contact customer service)
K16324specimen mount15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
L16327specimen mount25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight
M1623112.5mm mount12.2mm dia. x 10mm Cylinder, JEOL
O1611531.7mm dia. x 6.47mm, Cambridge S4 Mount
P1624212.7mm mountPin Mount: 12.7mm dia. x 15.7mm height, AMRAY special slotted head
Q1615325 x 10mm cylinder mount25mm dia. x 10mm Cylinder, JEOL
R1614425.4 x 10mm cylinder mountPin mount: D=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom
Order

Art.Description Unit PriceQuantity
660-615-A

Planotec Silicon Test Specimen, Certified, Mount A

Each € 1.086,60
✓
spinner
660-615-B

Planotec SiliconTest Specimen, Certified, Mount B

Each € 1.024,80
✓
spinner
660-615-C

Planotec Silicon Test Specimen, Certified, Mount C

Each € 1.024,80
✓
spinner
660-615-D

Planotec Silicon Test Specimen, Certified, Mount D

Each € 2.212,30
✓
spinner
660-615-E

Planotec Silicon Test Specimen, Certified, Mount E

Each € 1.024,80
✓
spinner
660-615-F

Planotec Silicon Test Specimen, Certified, Mount F

Each € 952,30
✓
spinner
660-615-G

Planotec Silicon Test Specimen, Certified, Mount G, you supply mount

Each € 1.155,70
✓
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660-615-K

Planotec Silicon Test Specimen, Certified, Mount K

Each € 1.004,30
✓
spinner
660-615-L

Planotec Silicon Test Specimen, Certified, Mount L

Each € 1.684,50
✓
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660-615-M

Planotec Silicon Test Specimen, Certified, Mount M

Each € 1.031,00
✓
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660-615-O

Planotec Silicon Test Specimen, Certified, Mount O

Each € 1.031,00
✓
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660-615-P

Planotec Silicon Test Specimen, Certified, Mount P

Each € 1.031,00
✓
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660-615-Q

Planotec Silicon Test Specimen, Certified, Mount Q

Each € 986,60
✓
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660-615-R

Planotec Silicon Test Specimen, Certified, Mount R

Each € 1.031,00
✓
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660-615-5

Planotec Test Specimen for incident light microscopy, Certified, Mounted on a blackened glass slide

Each € 1.105,10
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Brand: Ted Pella

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E-mail  :info@loeneninstruments.com

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