Skip to content
+ 31 (0)75 614 90 40
info@loeneninstruments.com
Contact
  • Log In | Log Out
  • Register
  • Account details
  • Log In | Log Out
  • Register
  • Account details
0
€ 0,00
×
  • Accessories for Microscopy
  • Instruments
  • Accessories for Microscopy
  • Instruments
Home / Accessories for Microscopy / Calibration / EDS/WDS/EPMA/XPS / X-Ray References Calibration / Pelco X-Checker Wafer
Product
Description
Order
Product

Pelco X-Checker Wafer
The PELCO X-Checker Wafer is available for systems set up for silicon wafer handling.
no. 602-20 and 602-21

Description

PELCO X-CHECKER Wafer

The PELCO X-Checker Wafer is available for systems set up for silicon wafer handling.
The PELCO X-Checker Wafer is available on standard 200mm (8″) and 300mm (12″) wafers, with eight standards for elemental and spatial calibrations.

The #602-20 and #602-21 contain:

  • Copper disc to check spectral calibration
  • Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution
  • Nickel 400 mesh TEM grid for imaging calibration
  • PTFE as a fluorine source to measure low energy resolution
  • Carbon to monitor calibration at the low end of the spectrum for thin window detectors
  • Aluminum foil disc
  • Boron nitride to test low energy performance/peak separation
  • 304 stainless steel for checking quantificationInstruction booklet and clamshell wafer storage case included.
Order

Art.Description Unit PriceQuantity
602-20

PELCO X-Checker Wafer, 200mm (8″)

Each € 2.126,70
✓
spinner
602-21

PELCO X-Checker Wafer, 200mm (12″)

Each € 2.658,30
✓
spinner
Brand: LamPlan

Contact

Van Loenen Instruments
Penningweg 69 E
1507 DE Zaandam

Tel :+31 75 614 90 40
E-mail  :info@loeneninstruments.com

BTW/VAT nr. :NL804 608 180 B01
KvK nr. :28038099

Sign up for our News Letter

Our partners

© 2025 Van Loenen Instruments