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Home / Accessories for Microscopy / SEM Supplies / Stubs, Mounts and Holders / Pin Stubs Specimen Mounts and Holders / Vise Clamp Holders / PELCO Double 1/2″ FIB Sample and Grid Holder
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Product

PELCO Double 1/2″ FIB Sample and Grid Holder
no. 15468

Description

PELCO Double 1/2″ FIB Sample and Grid Holder

The PELCO double FIB sample and Grid holder holds FIB samples mounted on two standard 1/2″ (12.7mm) pin stubs for FIB milling and lift-out procedures.
It also holds two FIB grids of the same thickness conveniently close to the sample to mount prepared TEM lamellae on the FIB grid for subsequent TEM imaging.
Compact and cost effective holder suitable for all FIB/SEM systems which accept pin mount holders, such as the FEI, ZEISS and Tescan systems.
For the JEOL and Hitachi systems a pin mount adapter is needed.

Made of vacuum grade aluminum with brass screws.
Philips screwdriver #0 included.

Overall size is 36.5 x 12.7 x 11.6mm (1.44″ x 0.5″ x 0.46″).
Standard 3.2mm (1/8″) pin.

Order

Art.Description Unit PriceQuantity
15468

PELCO Double 1/2″ FIB Sample and Grid Holder, Pin

Each € 437,00
✓
spinner
Brand: Ted Pella

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Van Loenen Instruments
Penningweg 69 E
1507 DE Zaandam

Tel :+31 75 614 90 40
E-mail  :info@loeneninstruments.com

BTW/VAT nr. :NL804 608 180 B01
KvK nr. :28038099

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