Skip to content
+ 31 (0)75 614 90 40
info@loeneninstruments.com
Contact
  • Log In | Log Out
  • Register
  • Account details
  • Log In | Log Out
  • Register
  • Account details
[fk_cart_menu]
€ 0,00 0 Cart
×
  • Accessories for Microscopy
  • Instruments
  • Accessories for Microscopy
  • Instruments
Home / Accessories for Microscopy / Calibration / SEM Calibration / Back Scattered Electron Test / Duplex Reference Specimen
Product
Description
Order
Product

Duplex Reference Specimen
An alternative and very sensitive test is by means of an alloy with two major copper/zinc phases
no. 655

Description

Duplex reference specimen

An alternative and very sensitive test is by means of an alloy with two major copper/zinc phases separated by an atomic number difference of 0.1.
The light phase illustrated in the micrograph has a mean atomic number of 29.47 and the dark phase a mean atomic number of 29.37.

Order

Art.Description Unit PriceQuantity
655

Duplex Reference Specimen

Each € 1.211,00
✓
spinner
Brand: Ted Pella

Contact

Van Loenen Instruments
Penningweg 69 E
1507 DE Zaandam

Tel :+31 75 614 90 40
E-mail  :info@loeneninstruments.com

BTW/VAT nr. :NL804 608 180 B01
KvK nr. :28038099

Sign up for our News Letter

Our partners

© 2025 Van Loenen Instruments