€ 0,00
Grating type TGX
The silicon calibration grating from the TGX series is an array of square holes with sharp undercut edges formed by the (110) crystallographic planes of silicon.
The typical radius of the edges is less than 5 nm.
Application
The TGX calibration gratings are intended for lateral calibration of SPM scanners. They can also be used for:
For accurate quantification of images of calibration gratings from the TGX series, we recommend using the Scanning Probe Image Processor (SPIP) designed by Image Metrology.
| Cat. no. | Grating type | Step height µm* |
Pitch µm |
Accuracy µm |
Edge radii mm |
Active area mm |
Chip dims. mm |
|---|---|---|---|---|---|---|---|
| AGF7026 | TGX01 | 1 | 3.0 | 0.1 | <5 | 1 x 1 | 5 x 5 x 0.3 |
* The step height value is given for information only, not for vertical calibration purposes
| Art. | Description | Unit | Price | Quantity | |
|---|---|---|---|---|---|
| AGF7026 | Grating Type TGX01 3 Micron Pitch |
Each | p.o.r. |
Van Loenen Instruments
Penningweg 69 E
1507 DE Zaandam
Tel :+31 75 614 90 40
E-mail :info@loeneninstruments.com
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