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Home / Accessories for Microscopy / Nanotechnology / Calibration / Performance Testing / Low & Medium Magnification / Aluminum-Tungsten Dendrites
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Aluminum-Tungsten Dendrites
Medium resolution test for Scanning Electron Microscopy
no. 620

Description

Aluminum-Tungsten Dendrites

medium resolution test for Scanning Electron Microscopy

The various spacings created by the dendritic structure give the gap test.
The topographical arrangement of dendrites leads to the gray level test.

The specimen is non-magnetic, vacuum clean, has no adverse reaction to the electron probe and requires no surface coating.
It is most useful for working in the probe size range of 25 to 75nm.

This standard is supplied unmounted with instructions and with a SEM micrograph.
Sample size is approximately 10mm dia. x 4mm high.

Order

Art.Description Unit PriceQuantity
620

Aluminum-Tungsten Dendrites Test Standard

Each € 405,80
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Brand: Ted Pella

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Van Loenen Instruments
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1507 DE Zaandam

Tel :+31 75 614 90 40
E-mail  :info@loeneninstruments.com

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KvK nr. :28038099

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