Skip to content
+ 31 (0)75 614 90 40
info@loeneninstruments.com
Contact
  • Log In | Log Out
  • Register
  • Account details
  • Log In | Log Out
  • Register
  • Account details
[fk_cart_menu]
€ 0,00 0 Cart
×
  • Accessories for Microscopy
  • Instruments
  • Accessories for Microscopy
  • Instruments
Home / Accessories for Microscopy / Calibration / TEM Calibration / TEM/STEM Test Specimens / 500nm Magnification Calibration Diffraction Grating Replica
Product
Description
Technical Note
Order
Product

500nm Magnification Calibration Diffraction Grating Replica
Carbon replica with Au/Pd shadowing on a cross line grating with well-defined trench type grooves.
no. 677

Description

500nm Magnification Calibration Diffraction Grating Replica

Carbon replica with Au/Pd shadowing on a cross line grating with well-defined trench type grooves.

Pitch or “d” spacing for parallel line grating is 500nm.

The trench type groove makes it easy to measure the pitch.

Typically, cross line grating is used up to 100,000x with 2,000 lines/mm in both directions.
Instructions included.

Made on a G400, 400 square mesh copper grid.

Technical Note

Technical Note

Download Technical Note
Order

Art.Description Unit PriceQuantity
677

500nm Grating Replica, Cross line grating, 2000 l/mm, on 3mm grid

Each € 66,80
✓
spinner
Brand: Ted Pella

Contact

Van Loenen Instruments
Penningweg 69 E
1507 DE Zaandam

Tel :+31 75 614 90 40
E-mail  :info@loeneninstruments.com

BTW/VAT nr. :NL804 608 180 B01
KvK nr. :28038099

Sign up for our News Letter

Our partners

© 2025 Van Loenen Instruments